In electronic devices, material imperfections play a key role in determining lifespan as well as in safety considerations. In this video, CHRISTIAN LIEBSCHER puts such defects under the microscope so that we can better understand their atomic structure. * Focusing on grain boundaries at which different crystals join together and using transmission electron microscopy, Liebscher explains how this research can bring about improvements in materials science and to the devices that we use in our daily lives. * This LT Publication is divided into the following chapters: 0:00 Question 2:07 Method 4:40 Findings 7:31 Relevance 9:43 Outlook