Kristallwachstum - Wachstum von Zinn-Whiskern im Raster-Elektronenmikroskop

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Formal Metadata

Title
Kristallwachstum - Wachstum von Zinn-Whiskern im Raster-Elektronenmikroskop
Subtitle
Crystal Growth - Growth of Tin Whiskers in the Scanning Electron Microscope
Author
Kehrer, H.-P.
Zaminer, Christian
License
No Open Access License:
German copyright law applies. This film may be used for your own use but it may not be distributed via the internet or passed on to external parties.
DOI
IWF Signature
E 1819
Publisher
IWF (Göttingen)
Release Date
1972
Language
Silent film
Producer
Siemens AG, Zentrale Forschung und Entwicklung, Forschungslaboratorien Bundesanstalt für Materialprüfung
Production Year
1970

Technical Metadata

IWF Technical Data
Film, 16 mm, 65 m ; SW, 6 min

Content Metadata

Subject Area
Abstract
Whisker / Zinn Zinn / elektronenmikroskopische Aufnahmen Kristallwachstum / Zinn-Whiskern
whisker / tin tin / electron microscopy crystal growth / tin-whisker
Keywords
Entstehung faden- und wulstförmiger Gebilde aus einer auf Cu elektrolytisch abgeschiedenen Sn-Schicht. Wachstum durch Materialzufuhr vom Fußpunkt, Whiskerbewegungen, Temperaturabhängigkeit der Wachstumsgeschwindigkeit. Zeitraffung.
Using a special time-laspe cinematographic technique and a speed of 11 frames per minute it was possible to record the growth of tin whiskers in a scanning-electron microscope. It will be noted that filament-type tin whiskers as well as bulbous shapes grow out ot the specimen which has been heated to 70° C and has an electroplated layer of tin on the surface, which is approximately 1 µm thick. It is apparent from the film that the growth of these whiskers is fed by material from the tin coating which moves upwards from the bottom of the coating. The swaying of the whiskers during growth, and the temperatured relation of the growth rate, become visible in ideal settings.
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Timings

  309 ms - page object

Version

AV-Portal 3.9.1 (0da88e96ae8dbbf323d1005dc12c7aa41dfc5a31)